Sondas de prueba de semiconductores con muelle de doble cara SCPA021

The test probe SCPA021 is 0.21 mm in barrel diameter. It can be applied to the tests of products which requires relatively high accuracy, for example semiconductor and communication devices.

Comentarios: Semiconductor test probes are usually called double-ended pogo pins. Common tip styles include B, J, J1, U, U1, etc. All of the probes are extremely thin and miniature, however, the requirement for their test accuracy is very strict. They are mainly applied to the fields of semiconductor tests and frequency tests of communication devices, for example, the frequency tests of mobile phones, walkie-talkies, computers, etc.

Barrel / Barril: phosphor bronze or gold clad phosphor bronze, gold and nickel plated / bronce fosforoso o bronce fosforoso revestido de oro, chapado en oro y níquel

Plunger / Émbolo: SK4, gold and nickel plated / SK4, chapado en oro y níquel

Spring / Muelle: SWP-A/B, gold and nickel plated / SWP-A/B, dorado y niquelado