Sonda de prueba de ensamblaje de placas de circuito impreso Serie PQL50

0,78 mm de diámetro. The in-circuit test probe PQL50 is 0.78 mm in diameter and 43.2 mm in length. Various tip styles are available for test probes. There are roughly four types of receptacles.

Unidad de medida: Piezas

Comentarios: In-circuit test probes are mainly used for testing electrical performance of in-circuit components on PCB and the connection between circuit networks. It could quantitatively measure components such as resistors, capacitors, inductors, crystal oscillators, and perform functional tests of diodes, triodes, optocouplers, transformers, relays, operational amplifiers, power supply modules and integrated circuits.

Barrel / Barril: phosphor bronze, gold and nickel plated / bronce fosforoso, chapado en oro y níquel

Plunger / Émbolo: beryllium copper, nickel plated or gold plated / cobre de berilio, niquelado o chapado en oro

Spring / Muelle: music wire, gold plated / cable de música, chapado en oro